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Nanoscale CMOS VLSI circuits : (Record no. 3424)

MARC details
000 -LEADER
fixed length control field 01608cam a2200349 a 4500
003 - CONTROL NUMBER IDENTIFIER
control field EG-NbEJU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240516114030.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240423t2010 nyua grb 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2010022678
015 ## - NATIONAL BIBLIOGRAPHY NUMBER
National bibliography number GBB011406
Source bnb
016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER
Record control number 015478365
Source Uk
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780071635196 (alk. paper)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 007163519X (alk. paper)
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)ocn426811674
040 ## - CATALOGING SOURCE
Original cataloging agency EG-NbEJU
Transcribing agency EG-NbEJU
Modifying agency EG-NbEJU
Language of cataloging eng
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871.99.M44
Item number K84 2010
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Kundu , Sandip
245 10 - TITLE STATEMENT
Title Nanoscale CMOS VLSI circuits :
Remainder of title design for manufacturability /
Statement of responsibility, etc. [by] : Sandip Kundu , Aswin Sreedhar
246 14 - VARYING FORM OF TITLE
Title proper/short title Nanoscale complementary metal oxide semiconductor very large-scale integration circuits
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York :
Name of publisher, distributor, etc. McGraw-Hill ,
Date of publication, distribution, etc. ©2010
300 ## - PHYSICAL DESCRIPTION
Extent xv , 296 pages :
Other physical details illustrations ;
Dimensions 24 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metal oxide semiconductors, Complementary
General subdivision Design and construction
Source of heading or term LCSH
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Very large scale integration
-- Design and construction
Source of heading or term LCSH
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nanoelectronics
Source of heading or term LCSH
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Sreedhar , Aswin ,
Relator term co-author
901 ## - Cataloger information
Cataloger Name sara sorur
902 ## - PDF File name
PDF File name ENG_03_(1161)
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type
    Library of Congress Classification     Fayza Aboulnaga Central Library | مكتبة فايزة أبو النجا المركزية بالحرم الجامعي Fayza Aboulnaga Central Library | مكتبة فايزة أبو النجا المركزية بالحرم الجامعي 05/16/2024   TK7871.99.M44 K84 2010 10011737 05/16/2024 C. 1 05/16/2024 Books

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