MARC details
| 000 -LEADER |
|---|
| fixed length control field |
18718cam a22006017a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
17242360 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
EG-NbEJU |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20241225203909.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
120404s2011 gw a b 001 0 eng d |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
2011288056 |
| 016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER |
|---|
| Record control number |
015691492 |
| Source |
Uk |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527339921 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527699018 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527699032 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783527699025 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(OCoLC)ocn676728907 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
BTCTA |
| Language of cataloging |
eng |
| Transcribing agency |
BTCTA |
| Modifying agency |
YDXCP |
| -- |
CDX |
| -- |
CIT |
| -- |
NLE |
| -- |
INU |
| -- |
UKMGB |
| -- |
OHX |
| -- |
BDX |
| -- |
DLC |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 042 ## - AUTHENTICATION CODE |
|---|
| Authentication code |
lccopycat |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK8322 |
| Item number |
.A37 2011 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.472 |
| Edition number |
22 |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Advanced characterization techniques for thin film solar cells . |
| Number of part/section of a work |
Volume 2 / |
| Statement of responsibility, etc. |
Edited by Daniel Abou-Ras , Thomas Kirchartz , and Uwe Rau |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
Second , Extended Edition |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Weinheim, Germany : |
| Name of publisher, distributor, etc. |
Wiley-VCH, |
| Date of publication, distribution, etc. |
2016 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
681 Pages : |
| Other physical details |
Illustrations ; |
| Dimensions |
25 cm |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographic references and index. |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
Machine generated contents note: |
| -- |
pt. one |
| Title |
Introduction -- |
| Miscellaneous information |
1. |
| Title |
Introduction to Thin-Film Photovoltaics / |
| Statement of responsibility |
Uwe Rau -- |
| Miscellaneous information |
1.1. |
| Title |
Introduction -- |
| Miscellaneous information |
1.2. |
| Title |
The Photovoltaic Principle -- |
| Miscellaneous information |
1.2.1. |
| Title |
The Shockley-Queisser Theory -- |
| Miscellaneous information |
1.2.2. |
| Title |
From the Ideal Solar Cell to Real Solar Cells -- |
| Miscellaneous information |
1.2.3. |
| Title |
Light Absorption and Light Trapping -- |
| Miscellaneous information |
1.2.4. |
| Title |
Charge Extraction -- |
| Miscellaneous information |
1.2.5. |
| Title |
Nonradiative Recombination -- |
| Miscellaneous information |
1.3. |
| Title |
Functional Layers in Thin-Film Solar Cells -- |
| Miscellaneous information |
1.4. |
| Title |
Comparison of Various Thin-Film Solar-Cell Types -- |
| Miscellaneous information |
1.4.1. |
| Title |
Cu(In, Ga)Se2 -- |
| Miscellaneous information |
1.4.1.1. |
| Title |
Basic Properties and Technology -- |
| Miscellaneous information |
1.4.1.2. |
| Title |
Layer-Stacking Sequence and Band Diagram of the Heterostructure -- |
| Miscellaneous information |
1.4.2. |
| Title |
CdTe -- |
| Miscellaneous information |
1.4.2.1. |
| Title |
Basic Properties and Technology -- |
| Miscellaneous information |
1.4.2.2. |
| Title |
Layer-Stacking Sequence and Band Diagram of the Heterostructure -- |
| Miscellaneous information |
1.4.3. |
| Title |
Thin-Film Silicon Solar Cells -- |
| Miscellaneous information |
1.4.3.1. |
| Title |
Hydrogenated Amorphous Si (a-Si: H) -- |
| Miscellaneous information |
1.4.3.2. |
| Title |
Metastability in a-Si: H: The Staebler-Wronski Effect -- |
| Miscellaneous information |
1.4.3.3. |
| Title |
Hydrogenated Microcrystalline Silicon (μc-Si: H) -- |
| Miscellaneous information |
1.4.3.4. |
| Title |
Micromorph Tandem Solar Cells |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
1.5. |
| Title |
Conclusions -- |
| -- |
References -- |
| Miscellaneous information |
pt. Two |
| Title |
Device Characterization -- |
| Miscellaneous information |
2. |
| Title |
Fundamental Electrical Characterization of Thin-Film Solar Cells / |
| Statement of responsibility |
Uwe Rau -- |
| Miscellaneous information |
2.1. |
| Title |
Introduction -- |
| Miscellaneous information |
2.2. |
| Title |
Current/Voltage Curves -- |
| Miscellaneous information |
2.2.1. |
| Title |
Shape of Current/Voltage Curves and their Description with Equivalent Circuit Models -- |
| Miscellaneous information |
2.2.2. |
| Title |
Measurement of Current/Voltage Curves -- |
| Miscellaneous information |
2.2.3. |
| Title |
Determination of Ideality Factors and Series Resistances -- |
| Miscellaneous information |
2.2.4. |
| Title |
Temperature-Dependent Current/Voltage Measurements -- |
| Miscellaneous information |
2.3. |
| Title |
Quantum Efficiency Measurements -- |
| Miscellaneous information |
2.3.1. |
| Title |
Definition -- |
| Miscellaneous information |
2.3.2. |
| Title |
Measurement Principle and Calibration -- |
| Miscellaneous information |
2.3.3. |
| Title |
Quantum Efficiency Measurements of Tandem Solar Cells -- |
| Miscellaneous information |
2.3.4. |
| Title |
Differential Spectral Response (DSR) Measurements -- |
| Miscellaneous information |
2.3.5. |
| Title |
Interpretation of Quantum Efficiency Measurements in Thin-Film Silicon Solar Cells -- |
| -- |
References -- |
| Miscellaneous information |
3. |
| Title |
Electroluminescence Analysis of Solar Cells and Solar Modules / |
| Statement of responsibility |
Uwe Rau -- |
| Miscellaneous information |
3.1. |
| Title |
Introduction -- |
| Miscellaneous information |
3.2. |
| Title |
Basics -- |
| Miscellaneous information |
3.3. |
| Title |
Spectrally Resolved Electroluminescence -- |
| Miscellaneous information |
3.4. |
| Title |
Spatially Resolved Electroluminescence of c-Si Solar Cells -- |
| Miscellaneous information |
3.5. |
| Title |
Electroluminescence Imaging of Cu(In, Ga)Se2 Thin-Film Modules |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
3.6. |
| Title |
Modeling of Spatially Resolved Electroluminescence -- |
| -- |
References -- |
| Miscellaneous information |
4. |
| Title |
Capacitance Spectroscopy of Thin-Film Solar Cells / |
| Statement of responsibility |
Pawel Zabierowski -- |
| Miscellaneous information |
4.1. |
| Title |
Introduction -- |
| Miscellaneous information |
4.2. |
| Title |
Admittance Basics -- |
| Miscellaneous information |
4.3. |
| Title |
Sample Requirements -- |
| Miscellaneous information |
4.4. |
| Title |
Instrumentation -- |
| Miscellaneous information |
4.5. |
| Title |
Capacitance-Voltage Profiling and the Depletion Approximation -- |
| Miscellaneous information |
4.6. |
| Title |
Admittance Response of Deep States -- |
| Miscellaneous information |
4.7. |
| Title |
The Influence of Deep States on CV Profiles -- |
| Miscellaneous information |
4.8. |
| Title |
DLTS -- |
| Miscellaneous information |
4.8.1. |
| Title |
DLTS of Thin-Film PV Devices -- |
| Miscellaneous information |
4.9. |
| Title |
Admittance Spectroscopy -- |
| Miscellaneous information |
4.10. |
| Title |
Drive Level Capacitance Profiling -- |
| Miscellaneous information |
4.11. |
| Title |
Photocapacitance -- |
| Miscellaneous information |
4.12. |
| Title |
The Meyer-Neldel Rule -- |
| Miscellaneous information |
4.13. |
| Title |
Spatial Inhomogeneities and Interface States -- |
| Miscellaneous information |
4.14. |
| Title |
Metastability -- |
| -- |
References -- |
| Miscellaneous information |
pt. Three |
| Title |
Materials Characterization -- |
| Miscellaneous information |
5. |
| Title |
Characterizing the Light-Trapping Properties of Textured Surfaces with Scanning Near-Field Optical Microscopy / |
| Statement of responsibility |
Karsten Bittkau -- |
| Miscellaneous information |
5.1. |
| Title |
Introduction -- |
| Miscellaneous information |
5.2. |
| Title |
How Does a Scanning Near-Field Optical Microscope Work? -- |
| Miscellaneous information |
5.3. |
| Title |
Light Scattering in the Wave Picture -- |
| Miscellaneous information |
5.4. |
| Title |
The Role of Evanescent Modes for Light Trapping -- |
| Miscellaneous information |
5.5. |
| Title |
Analysis of Scanning Near-Field Optical Microscopy Images by Fast Fourier Transformation |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
5.6. |
| Title |
How to Extract Far-Field Scattering Properties by Scanning Near-Field Optical Microscopy? -- |
| Miscellaneous information |
5.7. |
| Title |
Conclusion -- |
| -- |
References -- |
| Miscellaneous information |
6. |
| Title |
Spectroscopic Ellipsometry / |
| Statement of responsibility |
Robert W. Collins -- |
| Miscellaneous information |
6.1. |
| Title |
Introduction -- |
| Miscellaneous information |
6.2. |
| Title |
Theory -- |
| Miscellaneous information |
6.2.1. |
| Title |
Polarized Light -- |
| Miscellaneous information |
6.2.2. |
| Title |
Reflection from a Single Interface -- |
| Miscellaneous information |
6.3. |
| Title |
Ellipsometry Instrumentation -- |
| Miscellaneous information |
6.3.1. |
| Title |
Rotating Analyzer SE for Ex-Situ Applications -- |
| Miscellaneous information |
6.3.2. |
| Title |
Rotating Compensator SE for Real-Time Applications -- |
| Miscellaneous information |
6.4. |
| Title |
Data Analysis -- |
| Miscellaneous information |
6.4.1. |
| Title |
Exact Numerical Inversion -- |
| Miscellaneous information |
6.4.2. |
| Title |
Least-Squares Regression -- |
| Miscellaneous information |
6.4.3. |
| Title |
Virtual Interface Analysis -- |
| Miscellaneous information |
6.5. |
| Title |
RTSE of Thin Film Photovoltaics -- |
| Miscellaneous information |
6.5.1. |
| Title |
Thin Si: H -- |
| Miscellaneous information |
6.5.2. |
| Title |
CdTe -- |
| Miscellaneous information |
6.5.3. |
| Title |
CuInSe2 -- |
| Miscellaneous information |
6.6. |
| Title |
Summary and Future -- |
| Miscellaneous information |
6.7. |
| Title |
Definition of Variables -- |
| -- |
References -- |
| Miscellaneous information |
7. |
| Title |
Photoluminescence Analysis of Thin-Film Solar Cells / |
| Statement of responsibility |
Levent Gutay -- |
| Miscellaneous information |
7.1. |
| Title |
Introduction -- |
| Miscellaneous information |
7.2. |
| Title |
Experimental Issues -- |
| Miscellaneous information |
7.2.1. |
| Title |
Design of the Optical System -- |
| Miscellaneous information |
7.2.2. |
| Title |
Calibration -- |
| Miscellaneous information |
7.2.3. |
| Title |
Cryostat -- |
| Miscellaneous information |
7.3. |
| Title |
Basic Transitions -- |
| Miscellaneous information |
7.3.1. |
| Title |
Excitons -- |
| Miscellaneous information |
7.3.2. |
| Title |
Free-Bound Transitions -- |
| Miscellaneous information |
7.3.3. |
| Title |
Donor-Acceptor Pair Recombination -- |
| Miscellaneous information |
7.3.4. |
| Title |
Potential Fluctuations |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
7.3.5. |
| Title |
Band-Band Transitions -- |
| Miscellaneous information |
7.4. |
| Title |
Case Studies -- |
| Miscellaneous information |
7.4.1. |
| Title |
Low-Temperature Photoluminescence Analysis -- |
| Miscellaneous information |
7.4.2. |
| Title |
Room-Temperature Measurements: Estimation of Voc from PL Yield -- |
| Miscellaneous information |
7.4.3. |
| Title |
Spatially Resolved Photoluminescence: Absorber Inhomogeneities -- |
| -- |
References -- |
| Miscellaneous information |
8. |
| Title |
Steady-State Photocarrier Crating Method / |
| Statement of responsibility |
Rudolf Bruggemann -- |
| Miscellaneous information |
8.1. |
| Title |
Introduction -- |
| Miscellaneous information |
8.2. |
| Title |
Basic Analysis of SSPG and Photocurrent Response -- |
| Miscellaneous information |
8.2.1. |
| Title |
Optical Model -- |
| Miscellaneous information |
8.2.2. |
| Title |
Semiconductor Equations -- |
| Miscellaneous information |
8.2.3. |
| Title |
Diffusion Length: Ritter-Zeldov-Weiser Analysis -- |
| Miscellaneous information |
8.2.3.1. |
| Title |
Evaluation Schemes -- |
| Miscellaneous information |
8.2.4. |
| Title |
More Detailed Analyses -- |
| Miscellaneous information |
8.2.4.1. |
| Title |
Influence of the Dark Conductivity -- |
| Miscellaneous information |
8.2.4.2. |
| Title |
Influence of Traps -- |
| Miscellaneous information |
8.2.4.3. |
| Title |
Minority-Carrier and Majority-Carrier Mobility-Lifetime Products -- |
| Miscellaneous information |
8.3. |
| Title |
Experimental Setup -- |
| Miscellaneous information |
8.4. |
| Title |
Data Analysis -- |
| Miscellaneous information |
8.5. |
| Title |
Results -- |
| Miscellaneous information |
8.5.1. |
| Title |
Hydrogenated Amorphous Silicon -- |
| Miscellaneous information |
8.5.1.1. |
| Title |
Temperature and Generation Rate Dependence -- |
| Miscellaneous information |
8.5.1.2. |
| Title |
Surface Recombination -- |
| Miscellaneous information |
8.5.1.3. |
| Title |
Electric-Field Influence -- |
| Miscellaneous information |
8.5.1.4. |
| Title |
Fermi-Level Position -- |
| Miscellaneous information |
8.5.1.5. |
| Title |
Defects and Light-Induced Degradation |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
8.5.1.6. |
| Title |
Thin-Film Characterization and Deposition Methods -- |
| Miscellaneous information |
8.5.2. |
| Title |
Hydrogenated Amorphous Silicon Alloys -- |
| Miscellaneous information |
8.5.3. |
| Title |
Hydrogenated Microcrystalline Silicon -- |
| Miscellaneous information |
8.5.4. |
| Title |
Hydrogenated Microcrystalline Germanium -- |
| Miscellaneous information |
8.5.5. |
| Title |
Other Thin-Film Semiconductors -- |
| Miscellaneous information |
8.6. |
| Title |
Density-of-States Determination -- |
| Miscellaneous information |
8.7. |
| Title |
Summary -- |
| -- |
References -- |
| Miscellaneous information |
9. |
| Title |
Time-of-Flight Analysis / |
| Statement of responsibility |
Torsten Bronger -- |
| Miscellaneous information |
9.1. |
| Title |
Introduction -- |
| Miscellaneous information |
9.2. |
| Title |
Fundamentals of TOF Measurements -- |
| Miscellaneous information |
9.2.1. |
| Title |
Anomalous Dispersion -- |
| Miscellaneous information |
9.2.2. |
| Title |
Basic Electronic Properties of Thin-Film Semiconductors -- |
| Miscellaneous information |
9.3. |
| Title |
Experimental Details -- |
| Miscellaneous information |
9.3.1. |
| Title |
Accompanying Measurements -- |
| Miscellaneous information |
9.3.1.1. |
| Title |
Capacitance -- |
| Miscellaneous information |
9.3.1.2. |
| Title |
Collection -- |
| Miscellaneous information |
9.3.1.3. |
| Title |
Built-in Field -- |
| Miscellaneous information |
9.3.2. |
| Title |
Current Decay -- |
| Miscellaneous information |
9.3.3. |
| Title |
Charge Transient -- |
| Miscellaneous information |
9.3.4. |
| Title |
Possible Problems -- |
| Miscellaneous information |
9.3.4.1. |
| Title |
Dielectric Relaxation -- |
| Miscellaneous information |
9.3.5. |
| Title |
Inhomogeneous Field -- |
| Miscellaneous information |
9.4. |
| Title |
Analysis of TOF Results -- |
| Miscellaneous information |
9.4.1. |
| Title |
Multiple Trapping -- |
| Miscellaneous information |
9.4.1.1. |
| Title |
Overview of the Processes -- |
| Miscellaneous information |
9.4.1.2. |
| Title |
Energetic Distribution of Carriers -- |
| Miscellaneous information |
9.4.1.3. |
| Title |
Time Dependence of Electrical Current -- |
| Miscellaneous information |
9.4.2. |
| Title |
Spatial Charge Distribution -- |
| Miscellaneous information |
9.4.2.1. |
| Title |
Temperature Dependence |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
9.4.3. |
| Title |
Density of States -- |
| Miscellaneous information |
9.4.3.1. |
| Title |
Widths of Band Tails -- |
| Miscellaneous information |
9.4.3.2. |
| Title |
Probing of Deep States -- |
| -- |
References -- |
| Miscellaneous information |
10. |
| Title |
Electron-Spin Resonance (ESR) in Hydrogenated Amorphous Silicon (a-Si: H) / |
| Statement of responsibility |
Jan Behrends -- |
| Miscellaneous information |
10.1. |
| Title |
Introduction -- |
| Miscellaneous information |
10.2. |
| Title |
Basics of ESR -- |
| Miscellaneous information |
10.3. |
| Title |
How to Measure ESR -- |
| Miscellaneous information |
10.3.1. |
| Title |
ESR Setup and Measurement Procedure -- |
| Miscellaneous information |
10.3.2. |
| Title |
Pulse ESR -- |
| Miscellaneous information |
10.3.3. |
| -- |
10.4. |
| Title |
The g Tensor and Hyperfine Interaction in Disordered Solids -- |
| Miscellaneous information |
10.4.1. |
| Title |
Zeeman Energy and g Tensor -- |
| Miscellaneous information |
10.4.2. |
| Title |
Hyperfine Interaction -- |
| Miscellaneous information |
10.4.3. |
| Title |
Line-Broadening Mechanisms -- |
| Miscellaneous information |
10.5. |
| Title |
Discussion of Selected Results -- |
| Miscellaneous information |
10.5.1. |
| Title |
ESR on Undoped a-Si: H -- |
| Miscellaneous information |
10.5.2. |
| Title |
LESR on Undoped a-Si: H -- |
| Miscellaneous information |
10.5.3. |
| Title |
ESR on Doped a-Si: H -- |
| Miscellaneous information |
10.5.4. |
| Title |
Light-Induced Degradation in a-Si: H -- |
| Miscellaneous information |
10.5.4.1. |
| Title |
Excess Charge-Carrier Recombination and Weak Si-Si Bond Breaking -- |
| Miscellaneous information |
10.5.4.2. |
| Title |
Si-H Bond Dissociation and Hydrogen Collision Model -- |
| Miscellaneous information |
10.5.4.3. |
| Title |
Transformation of Existing Nonparamagnetic Charged Dangling-Bond Defects -- |
| Miscellaneous information |
10.6. |
| Title |
Alternative ESR Detection -- |
| Miscellaneous information |
10.6.1. |
| Title |
History of EDMR -- |
| Miscellaneous information |
10.6.2. |
| Title |
EDMR on a-Si: H Solar Cells |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
10.7. |
| Title |
Concluding Remarks -- |
| -- |
References -- |
| Miscellaneous information |
11. |
| Title |
Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells / |
| Statement of responsibility |
Iris Visoly-Fisher -- |
| Miscellaneous information |
11.1. |
| Title |
Introduction -- |
| Miscellaneous information |
11.2. |
| Title |
Experimental Background -- |
| Miscellaneous information |
11.2.1. |
| Title |
Atomic Force Microscopy -- |
| Miscellaneous information |
11.2.1.1. |
| Title |
Contact Mode -- |
| Miscellaneous information |
11.2.1.2. |
| Title |
Noncontact Mode -- |
| Miscellaneous information |
11.2.2. |
| Title |
Conductive Atomic Force Microscopy -- |
| Miscellaneous information |
11.2.3. |
| Title |
Scanning Capacitance Microscopy -- |
| Miscellaneous information |
11.2.4. |
| Title |
Kelvin Probe Force Microscopy -- |
| Miscellaneous information |
11.2.5. |
| Title |
Scanning Tunneling Microscopy -- |
| Miscellaneous information |
11.2.6. |
| Title |
Issues of Sample Preparation -- |
| Miscellaneous information |
11.3. |
| Title |
Selected Applications -- |
| Miscellaneous information |
11.3.1. |
| Title |
Surface Homogeneity -- |
| Miscellaneous information |
11.3.2. |
| Title |
Grain Boundaries -- |
| Miscellaneous information |
11.3.3. |
| Title |
Cross-Sectional Studies -- |
| Miscellaneous information |
11.4. |
| Title |
Summary -- |
| -- |
References -- |
| Miscellaneous information |
12. |
| Title |
Electron Microscopy on Thin Films for Solar Cells / |
| Statement of responsibility |
Sebastian S. Schmidt -- |
| Miscellaneous information |
12.1. |
| Title |
Introduction -- |
| Miscellaneous information |
12.2. |
| Title |
Scanning Electron Microscopy -- |
| Miscellaneous information |
12.2.1. |
| Title |
Imaging Techniques -- |
| Miscellaneous information |
12.2.2. |
| Title |
Electron Backscatter Diffraction -- |
| Miscellaneous information |
12.2.3. |
| Title |
Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry -- |
| Miscellaneous information |
12.2.4. |
| Title |
Electron-Beam-Induced Current Measurements -- |
| Miscellaneous information |
12.2.4.1. |
| Title |
Electron-Beam Generation -- |
| Miscellaneous information |
12.2.4.2. |
| Title |
Charge-Carrier Collection in a Solar Cell |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
12.2.4.3. |
| Title |
Experimental Setups -- |
| Miscellaneous information |
12.2.4.4. |
| Title |
Critical Issues -- |
| Miscellaneous information |
12.2.5. |
| Title |
Cathodoluminescence -- |
| Miscellaneous information |
12.2.5.1. |
| Title |
Example: Spectrum Imaging of CdTe Thin Films -- |
| Miscellaneous information |
12.2.6. |
| Title |
Scanning Probe and Scanning-Probe Microscopy Integrated Platform -- |
| Miscellaneous information |
12.2.7. |
| Title |
Combination of Various Scanning Electron Microscopy Techniques -- |
| Miscellaneous information |
12.3. |
| Title |
Transmission Electron Microscopy -- |
| Miscellaneous information |
12.3.1. |
| Title |
Imaging Techniques -- |
| Miscellaneous information |
12.3.1.1. |
| Title |
Bright-Field and Dark-Field Imaging in the Conventional Mode -- |
| Miscellaneous information |
12.3.1.2. |
| Title |
High-Resolution Imaging in the Conventional Mode -- |
| Miscellaneous information |
12.3.1.3. |
| Title |
Imaging in the Scanning Mode Using an Annular Dark-Field Detector -- |
| Miscellaneous information |
12.3.2. |
| Title |
Electron Diffraction |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
Note continued: |
| -- |
12.3.2.1. |
| Title |
Selected-Area Electron Diffraction in the Conventional Mode -- |
| Miscellaneous information |
12.3.2.2. |
| Title |
Convergent-Beam Electron Diffraction in the Scanning Mode -- |
| Miscellaneous information |
12.3.3. |
| Title |
Electron Energy-Loss Spectrometry and Energy-Filtered Transmission Electron Microscopy -- |
| Miscellaneous information |
12.3.3.1. |
| Title |
Scattering Theory -- |
| Miscellaneous information |
12.3.3.2. |
| Title |
Experiment and Setup -- |
| Miscellaneous information |
12.3.3.3. |
| Title |
The Energy-Loss Spectrum -- |
| Miscellaneous information |
12.3.3.4. |
| Title |
Applications and Comparison with EDX Spectroscopy -- |
| Miscellaneous information |
12.3.4. |
| Title |
Off-Axis and In-Line Electron Holography -- |
| Miscellaneous information |
12.4. |
| Title |
Sample Preparation Techniques -- |
| Miscellaneous information |
12.4.1. |
| Title |
Preparation for Scanning Electron Microscopy -- |
| Miscellaneous information |
12.4.2. |
| Title |
Preparation for Transmission Electron Microscopy -- |
| -- |
References -- |
| Miscellaneous information |
13. |
| Title |
X-Ray and Neutron Diffraction on Materials for Thin-Film Solar Cells / |
| Statement of responsibility |
Roland Mainz -- |
| Miscellaneous information |
13.1. |
| Title |
Introduction -- |
| Miscellaneous information |
13.2. |
| Title |
Diffraction of X-Rays and Neutron by Matter -- |
| Miscellaneous information |
13.3. |
| Title |
Neutron Powder Diffraction of Absorber Materials for Thin-Film Solar Cells -- |
| Miscellaneous information |
13.3.1. |
| Title |
Example: Investigation of Intrinsic Point Defects in Nonstoichiometric CuInSe2 by Neutron Diffraction |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
13.4. |
| Title |
Grazing Incidence X-Ray Diffraction (GIXRD) -- |
| Miscellaneous information |
13.5. |
| Title |
Energy Dispersive X-Ray Diffraction (EDXRD) -- |
| -- |
References -- |
| Miscellaneous information |
14. |
| Title |
Raman Spectroscopy on Thin Films for Solar Cells / |
| Statement of responsibility |
Alejandro Perez-Rodriguez -- |
| Miscellaneous information |
14.1. |
| Title |
Introduction -- |
| Miscellaneous information |
14.2. |
| Title |
Fundamentals of Raman Spectroscopy -- |
| Miscellaneous information |
14.3. |
| Title |
Vibrational Modes in Crystalline Materials -- |
| Miscellaneous information |
14.4. |
| Title |
Experimental Considerations -- |
| Miscellaneous information |
14.4.1. |
| Title |
Laser Source -- |
| Miscellaneous information |
14.4.2. |
| Title |
Light Collection and Focusing Optics -- |
| Miscellaneous information |
14.4.3. |
| Title |
Spectroscopic Module -- |
| Miscellaneous information |
14.5. |
| Title |
Characterization of Thin-Film Photovoltaic Materials -- |
| Miscellaneous information |
14.5.1. |
| Title |
Identification of Crystalline Structures -- |
| Miscellaneous information |
14.5.2. |
| Title |
Evaluation of Film Crystallinity -- |
| Miscellaneous information |
14.5.3. |
| Title |
Chemical Analysis of Semiconducting Alloys -- |
| Miscellaneous information |
14.5.4. |
| Title |
Nanocrystalline and Amorphous Materials -- |
| Miscellaneous information |
14.5.5. |
| Title |
Evaluation of Stress -- |
| Miscellaneous information |
14.6. |
| Title |
Conclusions -- |
| -- |
References -- |
| Miscellaneous information |
15. |
| Title |
Soft X-Ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces / |
| Statement of responsibility |
Clemens Heske -- |
| Miscellaneous information |
15.1. |
| Title |
Introduction -- |
| Miscellaneous information |
15.2. |
| Title |
Characterization Techniques -- |
| Miscellaneous information |
15.3. |
| Title |
Probing the Chemical Surface Structure: Impact of Wet Chemical Treatments on Thin-Film Solar Cell Absorbers |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
15.4. |
| Title |
Probing the Electronic Surface and Interface Structure: Band Alignment in Thin-Film Solar Cells -- |
| Miscellaneous information |
15.5. |
| Title |
Summary -- |
| -- |
References -- |
| Miscellaneous information |
16. |
| Title |
Elemental Distribution Profiling of Thin Films for Solar Cells / |
| Statement of responsibility |
Raquel Caballero -- |
| Miscellaneous information |
16.1. |
| Title |
Introduction -- |
| Miscellaneous information |
16.2. |
| Title |
Glow Discharge-Optical Emission (GD-OES) and Glow Discharge-Mass Spectroscopy (GD-MS) -- |
| Miscellaneous information |
16.2.1. |
| Title |
Principles -- |
| Miscellaneous information |
16.2.2. |
| Title |
Instrumentation -- |
| Miscellaneous information |
16.2.2.1. |
| Title |
Plasma Sources -- |
| Miscellaneous information |
16.2.2.2. |
| Title |
Plasma Conditions -- |
| Miscellaneous information |
16.2.2.3. |
| Title |
Detection of Optical Emission -- |
| Miscellaneous information |
16.2.2.4. |
| Title |
Mass Spectroscopy -- |
| Miscellaneous information |
16.2.3. |
| Title |
Quantification -- |
| Miscellaneous information |
16.2.3.1. |
| Title |
Glow Discharge-Optical Emission Spectroscopy -- |
| Miscellaneous information |
16.2.3.2. |
| Title |
Glow Discharge-Mass Spectroscopy -- |
| Miscellaneous information |
16.2.4. |
| Title |
Applications -- |
| Miscellaneous information |
16.2.4.1. |
| Title |
Glow Discharge-Optical Emission Spectroscopy -- |
| Miscellaneous information |
16.2.4.2. |
| Title |
Glow Discharge-Mass Spectroscopy -- |
| Miscellaneous information |
16.3. |
| Title |
Secondary Ion Mass Spectrometry (SIMS) -- |
| Miscellaneous information |
16.3.1. |
| Title |
Principle of the Method -- |
| Miscellaneous information |
16.3.2. |
| Title |
Data Analysis -- |
| Miscellaneous information |
16.3.3. |
| Title |
Quantification -- |
| Miscellaneous information |
16.3.4. |
| Title |
Applications for Solar Cells -- |
| Miscellaneous information |
16.4. |
| Title |
Auger Electron Spectroscopy (AES) -- |
| Miscellaneous information |
16.4.1. |
| Title |
Introduction -- |
| Miscellaneous information |
16.4.2. |
| Title |
The Auger Process -- |
| Miscellaneous information |
16.4.3. |
| Title |
Auger Electron Signals |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
16.4.4. |
| Title |
Instrumentation -- |
| Miscellaneous information |
16.4.5. |
| Title |
Auger Electron Signal Intensities and Quantification -- |
| Miscellaneous information |
16.4.6. |
| Title |
Quantification -- |
| Miscellaneous information |
16.4.7. |
| Title |
Application -- |
| Miscellaneous information |
16.5. |
| Title |
X-Ray Photoelectron Spectroscopy (XPS) -- |
| Miscellaneous information |
16.5.1. |
| Title |
Theoretical Principles -- |
| Miscellaneous information |
16.5.2. |
| Title |
Instrumentation -- |
| Miscellaneous information |
16.5.3. |
| Title |
Application to Thin Film Solar Cells -- |
| Miscellaneous information |
16.6. |
| Title |
Energy-Dispersive X-Ray Analysis on Fractured Cross Sections -- |
| Miscellaneous information |
16.6.1. |
| Title |
Basics on Energy-Dispersive X-Ray Spectrometry in a Scanning Electron Microscope -- |
| Miscellaneous information |
16.6.2. |
| Title |
Spatial Resolutions -- |
| Miscellaneous information |
16.6.3. |
| Title |
Applications -- |
| Miscellaneous information |
16.6.3.1. |
| Title |
Sample Preparation -- |
| -- |
References -- |
| Miscellaneous information |
17. |
| Title |
Hydrogen Effusion Experiments / |
| Statement of responsibility |
Florian Einsele -- |
| Miscellaneous information |
17.1. |
| Title |
Introduction -- |
| Miscellaneous information |
17.2. |
| Title |
Experimental Setup -- |
| Miscellaneous information |
17.3. |
| Title |
Data Analysis -- |
| Miscellaneous information |
17.3.1. |
| Title |
Identification of Rate-Limiting Process -- |
| Miscellaneous information |
17.3.2. |
| Title |
Analysis of Diffusing Hydrogen Species from Hydrogen Effusion Measurements -- |
| Miscellaneous information |
17.3.3. |
| Title |
Analysis of H2 Surface Desorption -- |
| Miscellaneous information |
17.3.4. |
| Title |
Analysis of Diffusion-Limited Effusion -- |
| Miscellaneous information |
17.3.5. |
| Title |
Analysis of Effusion Spectra in Terms of Hydrogen Density of States -- |
| Miscellaneous information |
17.3.6. |
| Title |
Analysis of Film Microstructure by Effusion of Implanted Rare Gases |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
17.4. |
| Title |
Discussion of Selected Results -- |
| Miscellaneous information |
17.4.1. |
| Title |
Amorphous Silicon and Germanium Films -- |
| Miscellaneous information |
17.4.1.1. |
| Title |
Material Density versus Annealing and Hydrogen Content -- |
| Miscellaneous information |
17.4.1.2. |
| Title |
Effect of Doping on H Effusion -- |
| Miscellaneous information |
17.4.2. |
| Title |
Amorphous Silicon Alloys: Si-C -- |
| Miscellaneous information |
17.4.3. |
| Title |
Microcrystalline Silicon -- |
| Miscellaneous information |
17.4.4. |
| Title |
Zinc Oxide Films -- |
| Miscellaneous information |
17.5. |
| Title |
Comparison with Other Experiments -- |
| Miscellaneous information |
17.6. |
| Title |
Concluding Remarks -- |
| -- |
References -- |
| Miscellaneous information |
pt. Four |
| Title |
Materials and Device Modeling -- |
| Miscellaneous information |
18. |
| Title |
Ab-Initio Modeling of Defects in Semiconductors / |
| Statement of responsibility |
Johan Pohl -- |
| Miscellaneous information |
18.1. |
| Title |
Introduction -- |
| Miscellaneous information |
18.2. |
| Title |
Density Functional Theory and Methods -- |
| -- |
Basis Sets -- |
| Miscellaneous information |
18.2.2. |
| Title |
Functionals for Exchange and Correlation -- |
| Miscellaneous information |
18.2.2.1. |
| Title |
Local Approximations -- |
| Miscellaneous information |
18.2.2.2. |
| Title |
Functionals Beyond LDA/GGA -- |
| Miscellaneous information |
18.3. |
| Title |
Methods Beyond DFT -- |
| Miscellaneous information |
18.4. |
| Title |
From Total Energies to Materials' Properties -- |
| Miscellaneous information |
18.5. |
| Title |
Ab-initio Characterization of Point Defects -- |
| Miscellaneous information |
18.5.1. |
| Title |
Thermodynamics of Point Defects -- |
| Miscellaneous information |
18.5.2. |
| Title |
Formation Energies from Ab-Initio Calculations -- |
| Miscellaneous information |
18.5.3. |
| Title |
Case study Point Defects in ZnO -- |
| Miscellaneous information |
18.6. |
| Title |
Conclusions -- |
| -- |
References -- |
| Miscellaneous information |
19. |
| Title |
One-Dimensional Electro-Optical Simulations of Thin-Film Solar Cells / |
| Statement of responsibility |
Thomas Kirchartz |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
19.1. |
| Title |
Introduction -- |
| Miscellaneous information |
19.2. |
| Title |
Fundamentals -- |
| Miscellaneous information |
19.3. |
| Title |
Modeling Hydrogenated Amorphous and Microcrystalline Silicon -- |
| Miscellaneous information |
19.3.1. |
| Title |
Density of States and Transport Hydrogenated Amorphous Silicon -- |
| Miscellaneous information |
19.3.2. |
| Title |
Density of States and Transport Hydrogenated Microcrystalline Silicon -- |
| Miscellaneous information |
19.3.3. |
| Title |
Modeling Recombination in a-Si: H and μc-Si: H -- |
| Miscellaneous information |
19.3.3.1. |
| Title |
Recombination Statistics for Single-Electron States: Shockley-Read-Hall Recombination -- |
| Miscellaneous information |
19.3.3.2. |
| Title |
Recombination Statistics for Amphoteric States -- |
| Miscellaneous information |
19.3.4. |
| Title |
Modeling Cu(In, Ga)Se2 Solar Cells -- |
| Miscellaneous information |
19.3.4.1. |
| Title |
Graded Band-Gap Devices -- |
| Miscellaneous information |
19.3.4.2. |
| Title |
Issues when Modeling Graded Band-Gap Devices -- |
| Miscellaneous information |
19.3.4.3. |
| Title |
Example -- |
| Miscellaneous information |
19.3.5. |
| Title |
Modeling of CdTe Solar Cells -- |
| Miscellaneous information |
19.3.5.1. |
| Title |
Baseline -- |
| Miscellaneous information |
19.3.5.2. |
| Title |
The Φb -- NAc (Barrier-Doping) Trade-Off -- |
| Miscellaneous information |
19.3.5.3. |
| Title |
C-V Analysis as an Interpretation Aid of I-V Curves -- |
| Miscellaneous information |
19.4. |
| Title |
Optical Modeling of Thin Solar Cells -- |
| Miscellaneous information |
19.4.1. |
| Title |
Coherent Modeling of Flat Interfaces -- |
| Miscellaneous information |
19.4.2. |
| Title |
Modeling of Rough Interfaces -- |
| Miscellaneous information |
19.5. |
| Title |
Tools -- |
| Miscellaneous information |
19.5.1. |
| Title |
AFORS-HET -- |
| Miscellaneous information |
19.5.2. |
| Title |
AMPS-1D -- |
| Miscellaneous information |
19.5.3. |
| Title |
ASA -- |
| Miscellaneous information |
19.5.4. |
| Title |
PC1D -- |
| Miscellaneous information |
19.5.5. |
| Title |
SCAPS |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Miscellaneous information |
19.5.6. |
| Title |
SC-SIMUL -- |
| -- |
References -- |
| Miscellaneous information |
20. |
| Title |
Two- and Three-Dimensional Electronic Modeling of Thin-Film Solar Cells / |
| Statement of responsibility |
Wyatt K. Metzger -- |
| Miscellaneous information |
20.1. |
| Title |
Introduction -- |
| Miscellaneous information |
20.2. |
| Title |
Applications -- |
| Miscellaneous information |
20.3. |
| Title |
Methods -- |
| Miscellaneous information |
20.3.1. |
| Title |
Equivalent-Circuit Modeling -- |
| Miscellaneous information |
20.3.2. |
| Title |
Solving Semiconductor Equations -- |
| Miscellaneous information |
20.4.2.1. |
| Title |
Creating a Semiconductor Model -- |
| Miscellaneous information |
20.4. |
| Title |
Examples -- |
| Miscellaneous information |
20.4.1. |
| Title |
Equivalent-Circuit Modeling Examples -- |
| Miscellaneous information |
20.4.2. |
| Title |
Semiconductor Modeling Examples -- |
| Miscellaneous information |
20.5. |
| Title |
Summary -- |
| -- |
References. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Photovoltaic cells |
| General subdivision |
Materials |
| -- |
Research. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Rau, U. |
| Fuller form of name |
(Uwe) |
| Relationship |
edt |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Abou-Ras, Daniel. |
| Relationship |
edt |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Kirchartz, Thomas. |
| Relationship |
edt |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
Contributor biographical information |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy1210/2011288056-b.html">http://www.loc.gov/catdir/enhancements/fy1210/2011288056-b.html</a> |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
Publisher description |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy1210/2011288056-d.html">http://www.loc.gov/catdir/enhancements/fy1210/2011288056-d.html</a> |
| 856 41 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
Table of contents only |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy1210/2011288056-t.html">http://www.loc.gov/catdir/enhancements/fy1210/2011288056-t.html</a> |
| 901 ## - Cataloger information |
|---|
| Cataloger Name |
Kholoud |
| 902 ## - PDF File name |
|---|
| PDF File name |
24122024_ (1) |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Library of Congress Classification |
| Suppress in OPAC |
No |
| Koha item type |
Books |
