Nanoscale CMOS VLSI circuits : design for manufacturability / [by] : Sandip Kundu , Aswin Sreedhar
Material type:
- 9780071635196 (alk. paper)
- 007163519X (alk. paper)
- Nanoscale complementary metal oxide semiconductor very large-scale integration circuits [Cover title]
- TK7871.99.M44 K84 2010
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Fayza Aboulnaga Central Library | مكتبة فايزة أبو النجا المركزية بالحرم الجامعي | TK7871.99.M44 K84 2010 (Browse shelf(Opens below)) | C. 1 | Available | 10011737 |
Browsing Fayza Aboulnaga Central Library | مكتبة فايزة أبو النجا المركزية بالحرم الجامعي shelves Close shelf browser (Hides shelf browser)
TK7871.86 .K48 2011 Principles of solar cells, LEDs and diodes : the role of the PN junction / | TK7871.99.M44 C574 2011 CMOS nanoelectronics : analog and RF VLSI circuits / | TK7871.99.M44 K36 2015 CMOS Digital Integrated Circuits : Analysis and Design / | TK7871.99.M44 K84 2010 Nanoscale CMOS VLSI circuits : design for manufacturability / | TK7871.99.M44 L44 2004 The design of CMOS radio-frequency integrated circuits / | TK7871.99.M44 L44 2004 The design of CMOS radio-frequency integrated circuits / | TK7871.99.M44 L44 2004 The design of CMOS radio-frequency integrated circuits / |
Includes bibliographical references and index
Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
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